Mutual transformation of thermal and anodic SiO2 films
- 30 April 1966
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 4 (4), 169-172
- https://doi.org/10.1016/0038-1098(66)90004-4
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- On the structure of vitreous SiO2— I. A new pentagonal dodecahedral modelJournal of Physics and Chemistry of Solids, 1965
- Structural Evaluation of Silicon Oxide FilmsJournal of the Electrochemical Society, 1965
- Dislocations in Webs of Germanium and SiliconJournal of Applied Physics, 1964
- Growth and Structure of Si Oxide Films on Si SurfaceJapanese Journal of Applied Physics, 1963
- Silicon Dioxide as Dielectric in Solid Electrolyte CapacitorsJournal of the Electrochemical Society, 1962
- Stabilization of Silicon Surfaces by Thermally Grown Oxides*Bell System Technical Journal, 1959