A comparison of vacuum-evaporated and ion-plated thin films using Auger electron spectroscopy
- 1 November 1978
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 54 (3), 303-308
- https://doi.org/10.1016/0040-6090(78)90386-3
Abstract
No abstract availableKeywords
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