Interface properties of hydrogenated amorphous carbon films on SiO2 and SiO1.2: an in situ photoelectron study
- 1 December 1992
- journal article
- Published by Elsevier in Surface Science
- Vol. 279 (1-2), 137-148
- https://doi.org/10.1016/0039-6028(92)90750-z
Abstract
No abstract availableThis publication has 26 references indexed in Scilit:
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