Yield optimization for arbitrary statistical distributions: Part II-Implementation
- 1 April 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 27 (4), 253-262
- https://doi.org/10.1109/tcs.1980.1084810
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Optimal centering, tolerancing, and yield determination via updated approximations and cutsIEEE Transactions on Circuits and Systems, 1978
- Yield estimation for efficient design centring assuming arbitrary statistical distributionsInternational Journal of Circuit Theory and Applications, 1978
- The simplicial approximation approach to design centeringIEEE Transactions on Circuits and Systems, 1977
- A nonlinear programming approach to optimal design centering, tolerancing, and tuningIEEE Transactions on Circuits and Systems, 1976
- Worst Case Network Tolerance OptimizationIEEE Transactions on Microwave Theory and Techniques, 1975
- Statistical analysis for practical circuit designIEEE Transactions on Circuits and Systems, 1975
- Nonlinear programming using minimax techniquesJournal of Optimization Theory and Applications, 1974
- Automated network design with optimal tolerancesIEEE Transactions on Circuits and Systems, 1974
- The automatic integration of ordinary differential equationsCommunications of the ACM, 1971
- Realistic Design Using Large-Change Sensitivities and Performance ContoursIEEE Transactions on Circuit Theory, 1971