X-ray diffraction analysis of low mismatch epitaxial layers grown on misoriented substrates
- 30 June 1994
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 140 (1-2), 205-212
- https://doi.org/10.1016/0022-0248(94)90514-2
Abstract
No abstract availableKeywords
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