In situ bulk lifetime measurement on silicon with a chemically passivated surface
- 1 January 1993
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 63 (1-4), 306-311
- https://doi.org/10.1016/0169-4332(93)90112-o
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Unusually Low Surface-Recombination Velocity on Silicon and Germanium SurfacesPhysical Review Letters, 1986
- The passivation of electrically active sites on the surface of crystalline silicon by fluorinationJournal of Vacuum Science & Technology A, 1985