Electro-optic mode-displacement silicon light modulator
- 15 September 1991
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 70 (6), 3355-3359
- https://doi.org/10.1063/1.349271
Abstract
A new type of guided-wave electro-optical intensity modulator is proposed and analyzed. The waveguide consists of an N-type Si core layer on a P-type Si substrate. Foward bias on the N+-N-P-P+ diode decreases the refractive index of the core and displaces the fundamental guided mode downward into the substrate. However, the mode is not extinguished because the substrate is bounded by a P+ contact. A spatial filter at the output converts the mode displacement into optical intensity modulation. A Poisson and continuity equation solver and multilayer waveguide simulation were used to obtain numerical estimates of mode displacement in a realistic structure.Keywords
This publication has 3 references indexed in Scilit:
- Simulation studies of silicon electro-optic waveguide devicesJournal of Applied Physics, 1990
- Silicon antiresonant reflecting optical waveguidesOptics Letters, 1990
- Waveguided electro-optical intensity modulation in a Si/GexSi1−x/Si heterojunction bipolar transistorElectronics Letters, 1990