Atomic and molecular ejection from ion-bombarded reacted single-crystal surfaces. Oxygen on copper(100)
- 1 December 1978
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 18 (11), 6000-6010
- https://doi.org/10.1103/physrevb.18.6000
Abstract
The trajectories of atomic and molecular species ejected from an ion-bombarded reacted single-crystal surface have been calculated using classical dynamics. As a model system, oxygen has been adsorbed in various coverages and site geometries on the (100) face of a copper surface, which is then bombarded by 600-eV ions at normal incidence. The oxygen atoms have been placed at near zero (single-atom adsorption), and coverages in an -top site, a fourfold bridge site, and a twofold bridge site. From the calculated positions and momenta of the ejected adsorbate and substrate atoms, we have identified the important ejection mechanisms, determined relative yields, and determined the factors that influence multimer formation. Of mechanistic interest is that oxygen is most often ejected by collisions with an adjacent copper atom rather than by collisions with the copper atom directly beneath it. The calculations show that multimers of the types , CuO, , , Cu, , and several tetramers and pentamers can be expected to form. These multimers establish their identity over the surface and do not directly eject as a molecular entity. The influence of site geometry on multimer yields is discussed in detail. In general, the bridge sites have higher multimer yields than the -top site. The surface coverage also exerts a systematic influence on the types of clusters that are observed. For example, molecules like and Cu are not likely to be ejected from a surface due to a large O-O separation distance.
Keywords
This publication has 15 references indexed in Scilit:
- Structure sensitive factors in molecular cluster formation by ion bombardment of single crystal surfacesSurface Science, 1978
- Low energy ion impact phenomena on single crystal surfacesSurface Science, 1978
- Work-Function Dependence of Negative-Ion Production during SputteringPhysical Review Letters, 1978
- The SIMS spectrum of the O-W(100) chemisorption systemSurface Science, 1978
- Oxygen adsorption on molybdenum studied by low-energy secondary-ion mass spectrometry and electron-induced desorptionPhysical Review B, 1977
- Depth profile detection limit of 3×1015 atom cm−3 for As in Si using Cs+ bombardment negative secondary ion mass spectrometryApplied Physics Letters, 1977
- Study of the sputtering of adsorbates by low energy ions (O on Ni)Surface Science, 1977
- Adsorption and surface reactivity of metals by secondary ion mass spectrometry. Part 1.—Adsorption of carbon monoxide on nickel and copperJournal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 1976
- Sputtering of chemisorbed gas (nitrogen on tungsten) by low-energy ionsJournal of Applied Physics, 1974
- Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)Surface Science, 1973