Influence of the gate leakage current on the noise performance of MESFETs and MODFETs
- 31 May 1995
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 38 (5), 1081-1087
- https://doi.org/10.1016/0038-1101(95)98678-v
Abstract
No abstract availableKeywords
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