Fabrication and charging characteristics of MOS capacitor structure with metal nanocrystals embedded in gate oxide
- 19 April 2007
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 40 (9), 2754-2758
- https://doi.org/10.1088/0022-3727/40/9/012
Abstract
No abstract availableKeywords
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