Inelastic changes in specimens during operation of the field-ion microscope
- 1 September 1971
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 24 (189), 593-602
- https://doi.org/10.1080/14786437108217032
Abstract
Field-induced changes taking place in field-ion microscope specimens of tungsten have been investigated by the methods of electron microscopy. In particular the behaviour of dislocations and grain boundaries and the reasons for specimen failure are discussed.Keywords
This publication has 11 references indexed in Scilit:
- Characterization of stacking faults with the field-ion microscopePhilosophical Magazine, 1970
- On the stability of stacking faults in B.C.C. crystalsPhilosophical Magazine, 1970
- Preliminary calculations of the electric field and the stress on a field-ion specimenPhilosophical Magazine, 1970
- Dissociated perfect dislocations in the field-ion imagePhilosophical Magazine, 1969
- The analysis of field-ion micrographs: Stacking faults in tungstenPhilosophical Magazine, 1968
- The occurrence of glissile Shockley loops in field-ion specimens of iridiumPhilosophical Magazine, 1968
- Preparation of contamination-free tungsten specimens for the field-ion microscopeJournal of Scientific Instruments, 1967
- Twinning of Iridium in a Field Ion MicroscopeJournal of Applied Physics, 1966
- Field ion microscope observations of stacking faults in tungstenJournal of the Less Common Metals, 1965
- Incorporation of slip dislocations in mechanical twins—IActa Metallurgica, 1961