The deposition and study of hard carbon films
- 15 May 1989
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 65 (10), 3914-3918
- https://doi.org/10.1063/1.343355
Abstract
Carbon films have been deposited by rf plasma decomposition of methane at 50–1400 V negative bias and 1.3×10−3–1.3×10−1 mbar pressure. Hardness, internal stress, density, hydrogen content, and infrared absorption depending on the preparation parameters have been measured. From the IR measurements the ratio of sp3 to sp2 bonds was calculated and the total amount of hydrogen in the films was determined by elastic recoil detection (0.5>H/C>0.15). We found in the range of bias voltages 0<‖−VB ‖VB ‖VB ‖3 and of the graphitelike films about 1.4 g/cm3. The microhardness seems to be correlated to the internal mechanical stress.Keywords
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