Photovoltaic properties and junction formation in CuInSe2

Abstract
Studies of diffusion and photovoltaic effects in CuInSe2 pn junctions are reported. Junctions were formed by annealing Zn‐, Cd‐, and Cu‐plated p‐type samples at temperatures from 200 to 450 °C. The most efficient photodetectors are formed by 5–10‐min anneals at 200 °C with a calculated interdiffusion coefficient of ∼5×10−10 cm2/sec.