Observation of dislocations in cadmium telluride by cathodoluminescence microscopy

Abstract
A one‐to‐one correspondence between deformation‐produced dark spots in cathodoluminescence (CL) micrographs and dislocations has been demonstrated in n‐type CdTe by comparing the CL pattern with the etch‐pit pattern developed with a new etchant which has been ascertained to reveal dislocations by a successive polishing and etching method.