Algorithms and Software Tools for IC Yield Optimization Based on Fundamental Fabrication Parameters
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 5 (1), 79-89
- https://doi.org/10.1109/tcad.1986.1270179
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
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