Retrieval of electron-excited Auger structure by dynamic background subtraction
- 1 January 1974
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 24 (1), 42-44
- https://doi.org/10.1063/1.1655002
Abstract
Electron‐excited Auger electron spectroscopy normally relies on differentiation of the electron energy spectrum to enhance signal contrast. The contrast is increased, however, only at the expense of signal strength and the Auger structure itself is not recovered. Dynamic background subtraction, which involves multiple differentiation followed by integration of the same order, is shown to rectify these difficulties.Keywords
This publication has 9 references indexed in Scilit:
- Quantitative Auger analysis using integration techniquesPhysics Letters A, 1973
- Exact corrections for potential modulation distortion in Auger yield measurementsSurface Science, 1973
- Properties of a New Nondifferentiating Method for Studying Structures in the Presence of a Distorted BackgroundCanadian Journal of Physics, 1973
- Fine structures and energy distribution of secondary electron emission from Si(111)Journal of Applied Physics, 1973
- Instrument Response Functions for Potential Modulation DifferentiationReview of Scientific Instruments, 1972
- Ionization Spectrometer for Elemental Analysis of SurfacesReview of Scientific Instruments, 1971
- A Soft X-Ray Appearance Potential Spectrometer for the Analysis of Solid SurfacesReview of Scientific Instruments, 1970
- Analysis of Materials by Electron-Excited Auger ElectronsJournal of Applied Physics, 1968
- Auger Peaks in the Energy Spectra of Secondary Electrons from Various MaterialsPhysical Review B, 1953