Crater edge profling of Ni/Cr sandwich multilayer thin films by scanning Auger microscopy (sam)
- 1 October 1980
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 2 (5), 183-186
- https://doi.org/10.1002/sia.740020506
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
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