In-depth information from auger electron spectroscopy
- 31 October 1974
- journal article
- Published by Elsevier in Surface Science
- Vol. 45 (2), 409-418
- https://doi.org/10.1016/0039-6028(74)90178-2
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Measurement of the ionization cross section of the L23-shell of chlorine using auger electron spectroscopyPhysics Letters A, 1973
- Distinction between adsorbed monolayers and thicker layers in Auger electron spectroscopyJournal of Physics F: Metal Physics, 1973
- Quantitative aspects of Auger electron spectroscopy; On the importance of attenuation of the primary electron beamSurface Science, 1973
- Auger-Plasmon-Satellite Intensities versus Depth—A Means for Determining Adatom Concentration ProfilesPhysical Review B, 1973
- Quantitative aspects of Auger electron spectroscopySurface Science, 1972
- Use of Auger Electron Spectroscopy and Inert Gas Sputtering for Obtaining Chemical ProfilesJournal of Vacuum Science and Technology, 1972
- Ellipsometry and the clean surfaces of silicon and germaniumSurface Science, 1971
- Angular dependences in electron-excited auger emissionSurface Science, 1969
- OPTIMIZATION OF AUGER ELECTRON SPECTROSCOPY IN LEED SYSTEMSApplied Physics Letters, 1968
- A new method for measuring electron impact ionization cross sections of inner shellsPhysics Letters A, 1967