Charge retention in scaled SONOS nonvolatile semiconductor memory devices—Modeling and characterization
- 31 October 1993
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 36 (10), 1401-1416
- https://doi.org/10.1016/0038-1101(93)90049-v
Abstract
No abstract availableKeywords
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