Application of the high-pressure thermoelectric technique for characterization of semiconductor microsamples: PbX-based compounds
- 31 March 2004
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 37 (8), 1151-1157
- https://doi.org/10.1088/0022-3727/37/8/002
Abstract
No abstract availableKeywords
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