X-Ray Observations of Anomalous Etch Patterns in Silicon Crystals
- 1 March 1967
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 6 (3), 420-421
- https://doi.org/10.1143/jjap.6.420
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Observations of Defects in Silicon Single CrystalsJapanese Journal of Applied Physics, 1966
- X-Ray Observations of Defect Structures in Silicon CrystalsJapanese Journal of Applied Physics, 1965
- X-Ray Observations of Partial Dislocations in Epitaxial Silicon FilmsJournal of Applied Physics, 1962
- Loop Shaped Images Observed in X-Ray Diffraction Micrographs of Silicon Single CrystalsJournal of the Physics Society Japan, 1962