Controlled Jet Polishing of Specimens for Transmission Electron Microscopy
- 1 May 1967
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 38 (5), 694-695
- https://doi.org/10.1063/1.1720806
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Automatic Unit for Thinning Transmission Electron Microscopy Specimens of MetalsReview of Scientific Instruments, 1966
- Micro-Electropolishing Transmission Electron Microscopy SpecimensReview of Scientific Instruments, 1965
- Electropolishing Unit for Rapid Thinning of Metallic Specimens for Transmission Electron MicroscopyReview of Scientific Instruments, 1964
- Microjet method for preparation of wire samples for transmission electron microscopyJournal of Scientific Instruments, 1963
- Method of preparing Si and Ge specimens for examination by transmission electron microscopyBritish Journal of Applied Physics, 1962
- Sample Preparation for Transmission Electron Microscopy of GermaniumReview of Scientific Instruments, 1961
- Preparation of Thin Metal Foils from Ordinary Tensile Specimens for Use in Transmission Electron MicroscopyReview of Scientific Instruments, 1961
- ELECTROLYTIC AND CHEMICAL POLISHINGMetallurgical Reviews, 1956
- ELECTROLYTIC AND CHEMICAL POLISHINGInternational Materials Reviews, 1956