Shallow donors and D-X centers neutralization by atomic hydrogen in GaAlAs doped with silicon

Abstract
Hydrogen plasma exposure of silicon‐doped Ga1−xAlxAs epilayers with xxx increases. For x≂0.25, the DX centers are very efficiently neutralized by hydrogen and, as a consequence, the conductivity mechanisms after exposure are only governed by the remaining shallow donors. For 0.29<xD‐X centers are neutralized, but the electron mobility after hydrogenation is reduced.