Electron Breakdown in Polar Insulating and Semiconducting Layers
- 16 January 1986
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 93 (1), 385-396
- https://doi.org/10.1002/pssa.2210930148
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Direct measurement of the energy distribution of hot electrons in silicon dioxideJournal of Applied Physics, 1985
- Monte Carlo Study of High-Energy Electrons in Silicon DioxidePhysical Review Letters, 1985
- Electron heating in silicon dioxide and off-stoichiometric silicon dioxide filmsJournal of Applied Physics, 1985
- Monte Carlo Solution to the Problem of High-Field Electron Heating in SiPhysical Review Letters, 1984
- Strong Electric Field Heating of Conduction-Band Electrons in SiPhysical Review Letters, 1984
- Monte-Carlo Approach of Electron Emission from SiO2Physica Status Solidi (a), 1984
- Monte-carlo calculation of electron attenuation in SiO2Physica Status Solidi (a), 1983
- Monte-Carlo Studies of the Electron Mobility in SiO2Physica Status Solidi (a), 1982
- ELECTRON EMISSION FROM SILICON DIOXIDE INTO VACUUMPublished by Elsevier ,1978
- Energy angular distributions of electrons emitted from MIM systemsThin Solid Films, 1973