Effects of stoichiometry on thermal stability of undoped, semi-insulating GaAs
- 1 August 1982
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 53 (8), 5771-5775
- https://doi.org/10.1063/1.331412
Abstract
We provide independent evidence of the effects of melt composition on the semi-insulating behavior and thermal stability of undoped GaAs crystals pulled from pyrolytic boron nitride crucibles by the liquid-encapsulated Czochralski technique. Semi-insulating crystals pulled from stoichiometric or As-rich melts show excellent stability to heat treatments, in contrast to semi- insulating Ga-rich material which exhibits p-type conversion after prolonged annealing at 860 °C. Deep level transient spectroscopy and Hall-effect measurements suggest that p-conversion is caused by outdiffusion of native As and/or Ga defects associated with the EL2 deep donors, resulting in uncompensated residual acceptors, predominantly carbon impurities at the surface. The measured mobility of undoped, semi-insulating GaAs is found empirically to be a sensitive parameter for qualifying substrates for direct ion implantation.Keywords
This publication has 11 references indexed in Scilit:
- Outdiffusion of the main electron trap in bulk GaAs due to thermal treatmentApplied Physics Letters, 1982
- Stoichiometry-controlled compensation in liquid encapsulated Czochralski GaAsApplied Physics Letters, 1982
- Growth and characterization of large diameter undoped semi-insulating GaAs for direct ion implanted FET technologySolid-State Electronics, 1981
- High-purity semi-insulating GaAs material for monolithic microwave integrated circuitsIEEE Transactions on Electron Devices, 1981
- Undoped semi-insulating LEC GaAs: a model and a mechanismElectronics Letters, 1981
- Thermal conversion of GaAsJournal of Applied Physics, 1980
- Arsenic precipitation at dislocations in GaAs substrate materialJournal of Applied Physics, 1980
- The incorporation and characterisation of acceptors in epitaxial GaAsJournal of Physics and Chemistry of Solids, 1975
- Measurement of High Resistivity Semiconductors Using the van der Pauw MethodReview of Scientific Instruments, 1973
- Properties of gold in siliconSolid-State Electronics, 1966