interface defect in thermal hyperfine interaction
- 15 December 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 58 (23), 15801-15809
- https://doi.org/10.1103/physrevb.58.15801
Abstract
An optimized electron spin resonance study has resulted in the observation of the full angular dependence of the hyperfine interaction spectrum associated with the unpaired electron of the point defect at the thermal interface, showing that the dominant interaction arises from a single isotope. The hyperfine tensor exhibits nearly axial (weakly monoclinic I) symmetry with and Molecular-orbital analysis indicates that the unpaired electron resides for ∼58% in a single unpaired Si hybrid orbital, found to be 14% s like and 86% p like, with the p orbital pointing closely along a 〈211〉 direction at 35.26° with the [100] interface normal. If O is excluded as an immediate part of the defect, the results establish the kernel of the defect as a tilted (∼22° about 〈01¯1〉) asymmetric, likely strained, unit. Like and is a prototype Si dangling bond defect. All available structural information may, in principle, be compatible with the moiety being incorporated as part of a defected strained Si-Si dimer configuration at slightly subinterfacial position. The dimer has previously been advanced as a natural building block in matching to (100)Si.
Keywords
This publication has 33 references indexed in Scilit:
- The silicon-silicon dioxide system: Its microstructure and imperfectionsReports on Progress in Physics, 1994
- Interface traps and P b centers in oxidized (100) silicon wafersApplied Physics Letters, 1986
- Electron spin resonance of [11̄1], [1̄11], and [111̄] oriented dangling orbital P b0 defects at the (111) Si/SiO2 interfaceApplied Physics Letters, 1986
- Electronic traps and P b centers at the Si/SiO2 interface: Band-gap energy distributionJournal of Applied Physics, 1984
- 2 9Si hyperfine structure of unpaired spins at the Si/SiO2 interfaceApplied Physics Letters, 1983
- Characterization of Si/SiO2 interface defects by electron spin resonanceProgress in Surface Science, 1983
- Interface states and electron spin resonance centers in thermally oxidized (111) and (100) silicon wafersJournal of Applied Physics, 1981
- ESR centers, interface states, and oxide fixed charge in thermally oxidized silicon wafersJournal of Applied Physics, 1979
- Study of Silicon-Silicon Dioxide Structure by Electron Spin Resonance IJapanese Journal of Applied Physics, 1971
- Si-SiO[sub 2] Fast Interface State MeasurementsJournal of the Electrochemical Society, 1968