The use of peak to background ratios (P/B) in AES and SAM: Have you ever wished you were better informed?
- 1 January 1988
- Vol. 38 (4-5), 337-340
- https://doi.org/10.1016/0042-207x(88)90073-5
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- The relation between Auger signal-to-background ratios and atomic concentrationApplied Surface Science, 1985
- A novel SAM technique for the direct measurement of backscattering factors and the elucidation of background shapes in AESSurface Science, 1985
- Channeling effects in polycrystalline copper—a serious impediment to quantitative Auger analysis?Surface and Interface Analysis, 1984
- Crystalline effects in Auger electron spectroscopySurface and Interface Analysis, 1984
- An important step in quantitative auger analysis: The use of peak to background ratioSurface Science, 1984
- Techniques for the correction of topographical effects in scanning Auger electron microscopyJournal of Applied Physics, 1983
- Scanning auger electron microscopy with high spatial or high energy resolutionVacuum, 1982
- Directional memory effects in inelastic photoelectron scatteringSurface Science, 1980
- A ratio technique for micro-Auger analysisSurface Science, 1977
- Angular dependence of Auger electron emission from a single crystal specimenVacuum, 1972