Recombination transitions in Zn–N-doped GaAs1−xPx in the direct and indirect composition regions
- 1 February 1974
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 45 (2), 795-799
- https://doi.org/10.1063/1.1663320
Abstract
The behavior of the Zn acceptor in conjunction with the N isoelectronic trap in GaAs1−xPx is studied. The photoluminescence spectra of GaAs1−xPx : N : Zn, doped p type by dilute Zn diffusion, are shifted to lower energy by an amount EZn≃30 meV (x < xc≃0.46, 77°K) for recombination transitions involving the Γ band edge, the A line, or NN pairs. For transitions involving the A line or NN pairs and crystal composition beyond the direct‐indirect transition (x > xc), the spectral shift due to the Zn acceptor weakens with increasing x, which is in accord with the relative weakening of k = 0 recombination components as EΓ increases relative to Eχ. Photopumped laser operation of GaAs1−xPx : N : Zn (x < 0.46) platelets is demonstrated on Zn–N transitions. No effect is observed attributable to Zn–N complexes.Keywords
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