Effects of O2 Addition on BCl3/Cl2 Plasma Chemistry for Al Etching
- 1 July 1997
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 36 (7S)
- https://doi.org/10.1143/jjap.36.4824
Abstract
Effects of low level (0.5–20%) O2 addition on BCl3/Cl2 plasma chemistry have been investigated using several diagnostic tools: optical emission spectroscopy, microwave interferometry, and mass spectrometry. Experiments were performed using a magnetically enhanced planar 13.56-MHz rf plasma reactor, where aluminum etching was also performed using samples masked with a photoresist pattern of lines and spaces. As O2 was added into a BCl3/Cl2 plasma, the Al etch rate first increased and then dropped above ≈3% O2 added; a transition from reactive-ion-etching (RIE) lag to inverse RIE lag occurred at an O2 percentage of ∼8%. Optical and mass spectrometric measurements indicated that the Cl concentration increases as O2 is added into a BCl3/Cl2 plasma, and that above a critical O2 percentage (∼6% O2) B x O y species are formed in the plasma through a reaction between boron chlorides and oxygen and then deposit onto the wafer surface during etching. The Al etching characteristics obtained in BCl3/Cl2/O2 plasmas are interpreted in terms of competitive effects of increased concentrations of Cl and B x O y .Keywords
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