Diffusion studies of Be-implanted GaAs by SIMS and electrical profiling
- 1 March 1978
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 25 (12), 1003-1008
- https://doi.org/10.1016/0038-1098(78)90893-1
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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